Special atomic force microscope for laboratory

Atomic force microscope, atomic force microscope price, high-quality atomic force microscope, laboratory special atomic force microscope, conductive atomic force microscope, dynamic atomic force microscope, near-field optical atomic force microscope, scanning tunneling microscope (price concessions) professional manufacturer and sales manufacturer: atomic force microscope FM nanoview 6800afm of Zhengzhou north south Instrument Equipment Co
, Ltd
detailed description I
main functional features (hardware system) 1 Optical electromechanical integration design, simple shape and structure; 2
The scanning probe is integrated with the sample table, with strong anti-interference ability; 3
Precision laser detection and probe positioning device, simple spot adjustment and convenient operation; 4
The sample approach probe method is adopted to make the needle tip perpendicular to the sample scanning; 5
The servo motor is controlled by manual or automatic pulse to drive the sample to approach the probe vertically to realize the accurate positioning of the scanning area; 6
High precision and wide range sample moving device, which can freely move the sample scanning area of interest; 7
High precision and wide range piezoelectric ceramic scanner, which can be selected according to the requirements of different precision and scanning range; 8
CCD observation system with optical positioning, real-time observation and positioning, probe scanning sample area; 9
Servo motor is used to control CCD auto focusing function; 10
The modular electronic control system is designed to facilitate the continuous improvement and maintenance of the circuit; 11
Integrated multiple scanning mode control circuits, used in conjunction with the software system
12
With temperature display
13
Spring suspension shockproof method, simple and practical, strong anti-interference ability , (software system): 1
The surface morphology image, amplitude image and phase image of the observable sample during scanning; 2
With contact, tapping, phase, friction, magnetic or electrostatic working modes; 3
The image sampling point can be freely selected as 256 & times; 256 or 512 & times; 512； 4
Multi channel image synchronous acquisition and display, real-time view of the profile; 5
Various curve force spacing (f-z), frequency RMS (f-rms) and RMS gap (rms-z) measurement functions; 6
The scanning area can be shifted and cut, and the sample area of interest can be selected arbitrarily; 7
The initial scanning angle of the sample can be arbitrarily selected; 8
Real time adjustment function of laser spot detection system; 9
Automatic and manual search function of needle tip formant; 10
The color palette function of the scanned image can be defined arbitrarily; 11
Support the real-time correction function of sample tilt line average and offset; 12
Support scanner sensitivity correction and automatic correction of electronic controller; 13
Support offline analysis and processing of sample images
2、 Main technical indicators: 1
Working mode: contact, tapping, expandable phase, friction, magnetic force or electrostatic force 2
Sample size: & phi& le; 90mm，H≤ 20mm3, maximum scanning range: transverse 50um, longitudinal 5um4, scanning resolution: transverse 0
2nm, longitudinal 0
05nm5, scanning rate: 0
6hz ~ 4
34hz6, scanning angle: arbitrary 7, sample moving range: 0 ~ 50mm8, motor approaching pulse width: 10 & plusmn; 2ms9, optical magnification: 10x10, optical resolution: 1um11, image sampling point: 256 & times; 256，512× 51212
Scanning control: XY adopts 18 Bit D / A, Z adopts 16 bit D / A13, data sampling: 14 bit a / D, dual 16 bit a / D multi-channel synchronous sampling 14, feedback mode: DSP digital feedback 15, feedback sampling rate: 64
0khz16, computer interface: USB2 017
Operating environment: run on Windows98 / 2000 / XP / 7 / 8 operating system