Spectral performance test system for multi junction solar cells

  The test system is configured according to the different needs of users, which can test the spectral response, spectral reflectivity and quantum efficiency of various types of cells (monocrystalline silicon, polycrystalline silicon, single junction, double junction and three junction thin-film solar cells) Or IPCE (monochromatic incident photo to electron conversion efficiency), spectral transmittance, short circuit current density, etc
Main features and parameters of the system:
1
Modular design, close to user needs, economic and flexible, wide application, and convenient upgrading, transformation and maintenance

2
High power tungsten halogen lamp and high power xenon lamp light source can be selected, or the light source existing or specified by the user can be used

3
The patented spectroscopic system ensures good wavelength accuracy and repeatability, eliminates the influence of multi-level spectrum and reduces stray light

4
Super strong and weak signal processing ability, effectively improve the signal-to-noise ratio and ensure the measurement accuracy

5
A variety of patented sample racks are available for selection, with convenient clamping, good electrode contact and little interference to weak signal test

6
Independent research and development of high-performance weak signal processor, including DC isolation preamplifier, which can effectively isolate the DC component generated by polarization, and can automatically switch all control and signals

7
Complete full automation special system software:
*The parameter setting and selection of spectroscopic system, multistage spectrum filtering device and weak signal processing system are integrated
*Automatic scanning, signal amplification, a / D, data acquisition and data processing, and automatic generation and display of chart files
*Multi format data and picture backup and printout function
*Multi group data comparison function
*Automatic removal of gross error and automatic verification of system error, linear error, periodic error and t error

System parameters:
Spectral range: 200-2500nm optional
Scan interval: & Ge; 1nm integer (adjustable)
Scanning mode: automatic
Two bias light sources can be configured to facilitate the test of complex thin film batteries with more than three junctions
Bias filter: seven, two short wave pass filters (imported), four long wave pass filters
Short circuit current density repeatability: & lt; 0
1% - 0
5% (the values of light sources with different properties and spectral range are slightly different)
Optional temperature control console: temperature control range: 5-40 ℃ (& plusmn; 0
5 ℃)
Test mode: AC or DC optional
Three automatic shutters can be selected to control the opening and closing of one main light and two polarized lights respectively
Optional dual monochromator
Optional dual optical path monitoring