3D optical profilometer, white light interferomete

  1、 , For product introduction, please call us for quotation, or visit China graphic instrument to contact us, http://www
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Superview W1 optical 3D surface profiler is a detection instrument used for sub nano measurement of the surface of various precision devices and materials
Based on the principle of white light interference technology, combined with precision Z-direction scanning module and 3D modeling algorithm, it carries out non-contact scanning on the device surface and establishes the surface 3D image
Through the system software, it carries out data processing and Analysis on the device surface 3D image, and obtains the 2D and 3D parameters reflecting the device surface quality, so as to realize the optical detection instrument for 3D measurement of device surface morphology

Superview W1 optical 3D surface profiler can be widely used in semiconductor manufacturing and packaging process inspection, 3C electronic glass screen and its precision accessories, optical processing, micro nano materials and manufacturing, auto parts, MEMS devices and other ultra precision processing industries, as well as aerospace, national defense and military industry, scientific research institutes and other fields
It can measure the roughness, flatness, micro geometric contour, curvature, etc
of all kinds of object surfaces from super smooth to rough, low reflectivity to high reflectivity, and workpieces from nano to micron
It provides more than 300 kinds of 2D and 3D parameters according to the four major domestic and foreign standards of ISO / ASME / EUR / GBT as evaluation standards

2、 , Product function 1) , The measurement and analysis software with integrated operation does not need to switch the interface
The configuration parameters are set in advance before measurement
The software automatically counts the measurement data and provides the function of data report export, which can quickly realize the function of batch measurement

2)  Automatic multi area measurement function, batch measurement, automatic focusing, automatic brightness adjustment and other automatic functions are provided in the measurement

3)  Splicing measurement function is provided in the measurement

4)  The analysis provides the data processing functions of four modules: position adjustment, correction, filtering and extraction
The position adjustment includes image leveling, mirroring and other functions; Correction includes spatial filtering, trimming, peak denoising and other functions; Filtering includes the functions of removing shape, standard filtering, filtering spectrum and so on; Extraction includes the functions of extracting region and section

5)  The analysis provides five analysis functions: roughness analysis, geometric profile analysis, structural analysis, frequency analysis and functional analysis
The roughness analysis includes full parameter analysis functions such as iso4287 line roughness, iso25178 surface roughness and iso12781 flatness according to the international standard; Geometric contour analysis includes the measurement of step height, distance, angle, curvature and other features, as well as the evaluation of straightness, roundness and geometric tolerance; Structural analysis includes hole volume and trough depth, etc; Frequency analysis includes texture direction and spectrum analysis; Function analysis includes SK parameters, volume parameters and other functions

  In the analysis, the auxiliary analysis functions such as one key analysis and multi file analysis are provided at the same time
The analysis template is set
Combined with the automatic measurement and batch measurement functions provided in the measurement, the batch measurement of small-size precision devices and the function of directly obtaining analysis data can be realized